Broad-Area Laser Bars for 1 kW-Emission: Demonstrating increased efficiency and narrowed far field

Broad-Area Laser Bars for 1 kW-Emission: Demonstrating increased efficiency and narrowed far field

  • 作者: Karow, Matthias M.
  • 原文出版社:Cuvillier
  • 出版日期:2022/07/20
  • 語言:英文
  • 定價:2716

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3期0利率每期9056期0利率每期452
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  • 臺灣與離島
  • 海外
  • 可配送點:台灣、蘭嶼、綠島、澎湖、金門、馬祖
  • 可取貨點:台灣、蘭嶼、綠島、澎湖、金門、馬祖
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內容簡介

Industrial laser systems for material processing applications rely on the availability of highly efficient, high-brightness diode lasers. GaAs-based broad-area laser bars play a vital role in such applications as pump sources for high-beam-quality solid-state lasers and, increasingly, as direct processing tools. This work studies 940 nm-laser bars emitting 1 kW optical power at room temperature, identifying those physical mechanisms that are currently limiting electrical-to-optical conversion efficiency as well as lateral beam quality. In the process, several diagnostic studies on bars with varied lateral-longitudinal design were carried out. The effects of technological measures for performance optimization were analyzed, yielding a new benchmark in efficiency and lateral divergence. The studies into altered resonator lengths of 4 and 6 mm as well as fill factors between 69 and 87 % successfully reduce both the voltage dropping across the device and power saturation at high currents, enabling 66 % efficiency at the operation point. Concrete measures how to reach efficiencies >=70 % are presented thereafter, showing that doubling the efficiency value of the first 1 kW-demonstration in 2007 - amounting to 35 % - is in near reach. Investigation of the beam quality bases on a herein proposed and realized concept, in which the far field is resolved for each individual bar emitter. In this way, it is possible to determine how far-field profiles vary along the bar width and how much these variations affect the overall bar far-field. Further, such effects specific to bar structures can be separated into non-thermal and thermal influences. The effect of mechanical chip deformation (bar smile) as well as neighboring-emitter interaction has been investigated for the first time in active kW-class devices, yielding a lateral divergence as low as 8.8 at the operation point.

 

詳細資料

  • ISBN:9783736976269
  • 規格:平裝 / 142頁 / 21.01 x 14.81 x 0.76 cm / 普通級 / 初版
  • 出版地:美國

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