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    您輸入的關鍵字: C. Michael (EDT) Herr

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    Frontiers of Characterization and Metrology for Nanoelectronics: 2009 International Conference on Frontiers of Characterization

    Frontiers of Characterization and Metrology for Nanoelectronics: 2009 International Conference on Frontiers of Characterization

    • 優惠價: 13140 元

    As the semiconductor industry continues to move toward silicon nanoelectronics and beyond, the intro... more
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    Frontiers Of Characterization And Metrology For Nanoelectronics: 2007 International Conference on Frontiers of Characterization

    Frontiers Of Characterization And Metrology For Nanoelectronics: 2007 International Conference on Frontiers of Characterization

    • 優惠價: 8950 元

    As the semiconductor industry continues to move toward silicon nanoelectronics and beyond, the intro... more
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