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Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration
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Integrated Circuit Defect-Sensitivity: Theory and Computational Models
The history of this book begins way back in 1982. At that time a research proposal was filed with th... more |
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
This book is essential to understand new test methodologies, algorithms and industrial practices. Wi... more |
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Low-power High-resolution Analog to Digital Converters: Design, Test and Calibration
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Integrated Circuit Defect-Sensitivity: Theory and Computational Models
The history of this book begins way back in 1982. At that time a research proposal was filed with th... more |
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Integrated Circuit Manufacturability: The Art of Process and Design Integration
"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design vari... more |
