博客來-作者-David G. Diebold

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		Frontiers of Characterization and Metrology for Nanoelectronics: 2011: Grenoble, France, 23 - 26 May 2011 外文書 , Alain C. (EDT)/ McDonald Amal (EDT)/ Secula David G. (EDT)/ Diebold Erik M. (EDT) Robert (EDT)/ Chabli Seiler , Ingram , 出版日期: 2012-04-26 優惠價: 11280 元 Emphasizes the frontiers of innovation in the characterization and metrology of nanoelectronics. Thi... more	可訂購時通知我
		Frontiers of Characterization and Metrology for Nanoelectronics: 2009 International Conference on Frontiers of Characterization 外文書 , Alain C. (EDT)/ McDonald C. Michael (EDT)/ Herr Dan (EDT) David G. (EDT)/ Diebold Robert (EDT)/ Garner Seiler , Ingram , 出版日期: 2010-02-28 優惠價: 13140 元 As the semiconductor industry continues to move toward silicon nanoelectronics and beyond, the intro... more	可訂購時通知我
		Frontiers Of Characterization And Metrology For Nanoelectronics: 2007 International Conference on Frontiers of Characterization 外文書 , Alain C. (EDT)/ McDonald C. Michael (EDT)/ Herr Dan (EDT) David G. (EDT)/ Diebold Robert (EDT)/ Garner Seiler , Ingram , 出版日期: 2007-09-26 優惠價: 8950 元 As the semiconductor industry continues to move toward silicon nanoelectronics and beyond, the intro... more	可訂購時通知我
		Characterization And Metrology for Ulsi Technology 2005 外文書 , Alain C. (EDT)/ McDonald Caroline R. (EDT)/ Khosla David G. (EDT)/ Diebold Rajinder P. (EDT) Robert (EDT)/ Ayre Seiler , Ingram , 出版日期: 2005-09-20 優惠價: 12250 元 Summarizes major issues and gives reviews of important measurement techniques that are crucial to th... more	可訂購時通知我
		Characterization and Metrology for Ulsi Technology 2003: International Conference on Characterization and Metrology for Ulsi Tec 外文書 , Alain C. (EDT)/ Shaffner David G./ Diebold Rajinde Robert (EDT)/ Zollner Seiler Stefan (EDT)/ Khosla T. J. (EDT)/ McDonald , Ingram , 出版日期: 2003-11-01 優惠價: 10500 元 This book/CD-ROM package presents papers from a March 2003 conference on progress in semiconductor t... more	可訂購時通知我

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