博客來-作者-Nicolici

		Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard 外文書 , Al-Hashimi Bashir M. Nicola Nicolici , Ingram , 出版日期: 2010-12-09 優惠價: 6599 元 Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to imp... more	放入購物車下次再買
		Power-Aware Testing and Test Strategies for Low Power Devices 外文書 , Girard Nicola (EDT)/ Wen Patrick (EDT)/ Nicolici Xiaoqing (EDT) , Ingram , 出版日期: 2009-11-23 優惠價: 10199 元 Managing the power consumption of circuits and systems is now considered one of the most important c... more	放入購物車下次再買
		Power-Constrained Testing of Vlsi Circuits 外文書 , Bashir Nicola/ Al-Hashimi Nicolici , Ingram , 出版日期: 2003-02-28 優惠價: 8000 元 Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to imp... more	放入購物車下次再買
		Power-Aware Testing and Test Strategies for Low Power Devices 外文書 , Girard Nicola Nicolici Patrick Wen Xiaoqing , Ingram , 出版日期: 2014-09-05 優惠價: 7199 元 Managing the power consumption of circuits and systems is now considered one of the most important c... more	放入購物車下次再買

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