熱門搜尋

    【我要重新搜尋】

    您輸入的關鍵字: Sascha (EDT) Glatzel

    分類(單選)
    配送方式(可複選)
    其他(可複選)
    ~

    搜尋結果共 2 筆, 頁數 1 / 1

    Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

    Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

    • 優惠價: 13199

    Presents the applications of Kelvin probe force microscopy in nanotechnology Provides an in-depth de... more

    Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces

    Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces

    • 優惠價: 6599

    Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique a... more

    搜尋推薦

    您可能感興趣的活動

    • OPEN POINT 點數變現金 | 1點=1元,消費100%抵用無上限