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    Design-for-Test and Test Optimization Techniques for TSV-Based 3D Stacked ICs

    Design-for-Test and Test Optimization Techniques for TSV-Based 3D Stacked ICs

    • 優惠價: 6599 元

    This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that...... more
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    Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

    Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

    • 優惠價: 8399 元

    The modern electronic testing has a forty year history. Test professionals hold some fairly large co... more
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    Concurrent and Comparative Discrete Event Simulation

    Concurrent and Comparative Discrete Event Simulation

    • 優惠價: 6599 元
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    Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal Vlsi Circuits

    Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal Vlsi Circuits

    • 優惠價: 6000 元

    The modern electronic testing has a forty year history. Test professionals hold some fairly large co... more
    放入購物車 下次再買